Original document(24 pages)  中文版
    This invention relates to a high-frequency clock jitter measuring circuit and calibration method thereof, which comprises a first/second oscillation signal unit to generate the first/second oscillation signal with TV1/TV2 period (TV1
Application Number
申请号		 200610035151 Application Date
申请日		 2006.04.18
Title 名称 High-frequency clock jitter measuring circuit and calibration method thereof
Publication Number
公开号		 1837835 Publication Date
公开日		 2006.09.27
Approval Pub. Date Granted Pub. Date
International Classification 分类号 G01R29/02,G01R23/02,G01R31/00,H03K5/19
Applicant(s) Name
申请人		 Peking University Shenzhen Graduate School
Address 地址 518057
Inventor(s) Name 发明人 Zhang Jingkai, Li Chongren, Yu Fei
Attorney & Agent 代理人 guo yan

  
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