A semiconductor device (100) may include a substrate (110) and an insulating layer (120) formed on the substrate (110). A first device (710) maybe formed on the insulating layer (120), including a first fin (130). The first fin (130) maybe formed on the insulating layer (120) and may have a first fin aspect ratio. A second device (720) may be formed on the insulating layer (120), including a second fin (130). The second fin (130) may be formed on the insulating layer (120) and may have a second fin aspect ratio different from the first fin aspect ratio. |