Original document(29 pages)  中文版
    Title: Image testing device
Application Number
申请号
200510135032 Application Date
申请日
2005.12.21
Title 名称 Image testing device
Publication Number
公开号
1800836 Publication Date
公开日
2006.07.12
Approval Pub. Date Granted Pub. Date
International Classification 分类号 G01N21/956,G01N21/958
Applicant(s) Name
申请人
Olympus Corp.
Address 地址
Inventor(s) Name 发明人 Kurata Shunsuke
Attorney & Agent 代理人 li hui

  
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Sample rack for X-ray diffraction phase analysis and analysis method thereof
Gallium oxide gas sensing film doped with metal oxide and preparation method thereof
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