Original document(18 pages) Authorized document(17 pages) 中文版
    The invention relates to a non-corresponding substrate visual aligning method, comprising the steps of: providing a first aligning substrate and a second aligning substrate; selecting at least two first characteristic points on the first aligning substrate and calculating at least a first aligning point relative to the first characteristic points; selecting at least two second characteristic points on the second substrate and calculating at least a second aligning point relative to the second characteristic points; using a teaching frame only able to drag position but unable to change size, selecting a corresponding position and teaching the first aligning substrate to align with the second one; in the aligning state, calculating a relative position to the first and second aligning points.
Application Number
申请号
200410100998 Application Date
申请日
2004.12.30
Title 名称 Visual contraposition method of not corresponding basis material
Publication Number
公开号
1797425 Publication Date
公开日
2006.07.05
Approval Pub. Date 2007.08.29 Granted Pub. Date 2007.08.29
International Classification 分类号 G06K9/32;G06K9/46;H05K13/08;H01L21/00
Applicant(s) Name
申请人
Ind Tech Inst
Address 地址
Inventor(s) Name 发明人 Cai Yahui;Liu Jnxian;Lin Hongyi;Huang Qingguo;Chen Weiyu
Attorney & Agent 代理人 liang hui xu jinguo

  
Mechanizm for taking and putting material
Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data
Method and device of determing binary-state threshold of text, and storage medium
Method and device for self-adaptive binary state of text, and storage medium
System and method of 2D analytical process for image
Circuit for picking up signal of unicolor bright spot
Method and system for correcting output of printer devices
Process for producing graphic object
Method, program and unit for controlling library arrangement
Entrance ticket management system and entrance ticket management method
Google
Note:All patent data come from State Intellectual Property Office of the People's Republic of China. If there were discrepancies between here and the State Intellectual Property office, the later is more accurate. The patent data is only for public exchange and learning purposes. We are not responsible for the adverse consequences with unverified use of the data.