| Original document(47 pages) 中文版 |
The X-ray inspection device and the X-ray inspection method according to the present invention are configured to hold an object to be inspected irradiated with an X-ray from an X-ray irradiation device, uses a swinging device for performing swinging motion of tilting the object to be inspected at an arbitrary angle and in an arbitrary direction, images the X-ray that passes through the object to be inspected in an X-ray detection device and extracts data of a desired cross section from the X-ray image of the X-ray detection device in a control device. |
Application Number
申请号 |
200410088251 |
Application Date
申请日 |
2004.08.27 |
| Title 名称 |
X-ray inspection apparatus and x-ray inspection method
|
Publication Number
公开号 |
1595124 |
Publication Date
公开日 |
2005.03.16 |
| Approval Pub. Date |
|
Granted Pub. Date |
|
| International Classification 分类号 |
G01N23/04,H05G1/26,H05G1/08,H05G1/02 |
Applicant(s) Name
申请人 |
Matsushita Electric Ind Co., Ltd. |
| Address 地址 |
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| Inventor(s) Name 发明人 |
Ichihara Masaru, Yoshino Shinji, Inoue Hiroyuki, Kinoshita Toshio |
| Attorney & Agent 代理人 |
bao yudun |
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